We can perform high-temperature rapid annealing, which is necessary for the activation of compound semiconductors.
We provide a comprehensive range of processes to reduce and alleviate damage during SiC device creation, from high-temperature ion implantation to carbon cap film deposition to prevent substrate surface roughening during annealing, high-temperature rapid annealing, and cap film removal. Moreover, we provide carbon cap technology to prevent substrate roughening due to Si evaporation during activation annealing.
Heating System |
Vertical High-Frequency Induction Heating System |
---|---|
Heating Temperature |
Until 1800℃ |
Atmosphere |
Ar, N2 |
Sample Size |
5 mm square to 6-inch wafer |
Sample Type |
SiC, GaN and others |